DesignCon 2008 Performance at the DUT: Techniques for Evaluating the Performance of an ATE System at the Device Under Test Socket
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A Generic Test Path and DUT Model for DataCom ATE
It is well known that the output signals measured by an automatic test equipment (ATE) system are not only due to the device-under-test (DUT), but also due to the test path. For example, if the intersymbol interference (ISI) due to the test path is not negligible, then the performance of the DUT can be grossly underestimated. In this paper, we propose a generic model for both the test path and ...
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تاریخ انتشار 2007